Industrial Group meetings in 2000
Meetings listed in this file are:
BCA Spring Meeting 2000.
Heriot-Watt University, Edinburgh 3 - 5 April 2000.<
/h3>
-
- Pharmaceuticals
-
Monday 3rd April, 10.00 - 12.30 and Tuesday
4th April, 09.00 - 12.00.
Theme: Crystallisation methodology and practice covering
crystal structure prediction, polymorph screening, techniques for
growing single crystals, crystal habit prediction and control,
polymorph selection and batch processing.
The sessions incorpo
rate:
The Alun Bowen Industrial Lecture
at 10.00 on Monday 3rd April
Professor Stephen Byrn, Purdue University
Crystallisation of pharmaceuticals
Other speakers:
Kevin Roberts (Heriot-Watt)
Batch processing
Christian Lehmann (Max Planck Institute, Berlin)
Polymorph screening
Norman Shankland (Strathclyde)
Te
chniques for growing single crystals
Steef Boerrigter (Nijmegen)
Crystal habit prediction, control and manipulation
Nick Blagden (UMIST)
Polymorph selection: additives and solvents
For further information, contact:
Philip Lake, Glaxo Wellcome
Temple Hill, Dartford DA1 5AH
Tel. 01322 391971, fax. 01322 390201,
email: [email protected]
-
Specimen Preparation Workshop
Tuesday 4th April, 14.00 - 17.30.
Speakers will include:
14.00 Steve Norval (ICI)
Introduction
14.00 Jeremy Cockroft (Birkbeck)
Specimen preparation for XRPD: aspirin to zeolites
14.45 Stephen Hillier (Macaulay Land Use Research
Institute)
Spray drying for XRPD specimen preparation
15.30 Tea
16.00 S
teve Norval (ICI)
Report and discussion of specimen preparation "Round-Robin"
16.45 Colin Small (Rolls-Royce)
Metal specimen preparation for texture analysis
17.00 Open Forum
17.30 Close
"Round-Robin" Samples
A number of samples are available for participants to prepare
and measure in their laboratories for comparison at the workshop.
These comprise inorganic and organic powders with a tendency to
preferre
d orientation, a titanium alloy for texture measurement
and a coarse metal powder for lattice parameter measurement.
This will not be a formal round-robin, but is intended to
promote discussion of techniques at the workshop. Anonymity of
data from laboratories will be maintained, unless there is prior
agreement. Other short contributions and problems for discussion
will be welcome.
To obtain samples or for other information, contact:
Steve N
orval, ICI plc, Science Support Group,
Wilton Centre, PO Box 90, Wilton, Middlesbrough TS90 8JE,
tel. 01642 432005, fax. 01642 432244, email:
[email protected].
-
Controlled Environment XRD
Wednesday 5th April, 14.00 - 16.40
The following speakers have been arranged:
14.00 Introduction
14.05 Simon Redfern (University of Cambridge)
Investigating the dynamics of high-temperature phase transitions
by in-situ stroboscobic diffraction
14.25 John Loveday (University of Edinburgh)
Neutron diffraction at high pressure - clathrates to boron
carbides
14.45 Andrew Harrison (University of Edinburgh)
In situ diffraction studies of microwave-heated reactions
15.05 Chris Frampton (Roche Discovery)
Variable relative humidity XRPD of pharmaceuticals
15.25 Questions
15.30 Coffee
16.00 Martin Soar (BP, Sunbury)
In situ XRD and its role in Catalyst Development
16.20 John Evans (University of Durham)
Studies on negative thermal expansion and low temperature oxygen
migration using variable temperature powder diffraction
16.40 Close
For further information, contact:
Dave Taylor, 35 Birchley Road, Billinge,
Wigan, Lancs WN5 7QJ
tel. 01744 893108, email: djt
[email protected]
Workshop on Non Ambient Diffraction Techniques.
Birkbeck College, London, 21 June 2000
Registration Form
Workshop Tutors - Jeremy Cockcroft & Dave
Taylor
09.30
Registration &
Coffee
10.00
Welcome and Introduct
ion
10.10
Instrumentation. -Choice of
settings - Diffractometer, Detectors, Source, Optics.
Environmental Stage
High temp Type - Strip heater, Chamber, Capillary,
Microwave, Laser.
Low Temp- Gas stream, Cryostat, Peltier.
Environment - Gaseous, 0-10 Bar Pressure, Humidity.
Sample holders
Temperature
Measurement -Thermocouple low-high,
Silicon Diode very
low, Resistors low- high, Pyrometry very high
Validation, Melting point, Phase Changes, Lattice
parameters
12.30
Buffet Lunch
Working demonstrations of Chamber and Cryostat
systems
14.00
Data Handling
Data Quality- Fit for the purpose, Background
Processing - Plotting, Data quantity
Reaction Kinetics
Quantification -Standards, Internal External,
Matrix, Strip
Advantages and disadvantages - Synchrotron /Neutrons
sources
Applications - Examples
Discussion - User problems
16.00
Tea and Close
Please bring along a few overheads if you want to share your
experience, explain a problem or demonst
rate an application.
For further information and late registration please
contact:
J K Cockcroft Tel 020 7631 6800 x2824 Fax 020 7631 6803 Email
[email protected]
Structural Materials Workshop -
12th Sept 2000,
Manchester Materials Science Center.
Residual Stress In Context. How To Choose A
Technique.
Registration Form
In the dif
fraction community residual stress is frequently
only considered in the context of X-Ray diffraction, or if you
are very lucky neutron diffraction. However in reality these are
only two out of many techniques that can provide residual stress
data. Each method has its own strengths and weaknesses and it is
often a case of looking at the problem, what time and form of
data you want, how quickly and at what cost before a technique
can be chosen.. The aim of this workshop is to introduce some of
these o
ther techniques and how they relate to the type of
information generated by diffraction based techniques. The
proposed format is a workshop that will review as many techniques
as possible. The provisional programme is outline below.
PROVISIONAL PROGRAMME
10:30 Introduction Judith Shackleton - Manchester
Univ
10:45 XRD TechniquesPhilip Holdway - DERA
11:15 Magnetic Techniques Brian Shaw - Newcastle
Univ
11
:45 Optical Techniques Dr Richard Burgette - British
Aerospace
12:15 Neutrons Mike Fitzpatrick - Open Univ
12:45 LUNCH
2:00 EBSD Angus Wilson - Oxford Univ
2:30 Synchrotrons Prof Phil Withers - Manchester
Univ
3:00 Hole Drilling/Removal Dr Lyndon Edwards - Open
Univ
3:30 Discussion
4:00 Tea and Optional Tour of the Facilities at the Materials
Science Centre
The sessions will be mo
re like tutorials than lectures.
Questions and discussion will be very welcome during the
sessions. The object of the day is to provide a list of
techniques, contacts, and capabilities so that users know where
to go to for advice.
Full details will be published in the next IG News and
Crystallography News. For further information, suggestions of
content or offers of help please contact:
Judith Shackleton, Manchester Univ. Telephone 0161-200-3581,
e-mail [email protected]
Autumn Meeting -Crystallography in Industry
Thursday 2 November 2000, Roche Discovery Welwyn
Registration Form
PROVISIONAL PROGRAMME
09:45 Registration and Coffee
10:20 Welcome Remarks Prof. Chris Frampton
10:30 A Case Study: Quantification of Polymorphism in API and
Tablet by XRPDDr Brett Coop
er
11:00 Progress in Indexing New Powder Diffraction Patterns
Dr Robin Shirley
11:30 Zopiclone Update Prof. Chris Frampton
12:00 ICDD - BCA Representatives Report on New Developments
Mr David Taylor
12:30 Buffet Lunch and Software Demonstration
13:45 BCA Industrial Group Award Presented by Dr Steve
Norval
14:00 BCA IG Award Lecture Dr David Dyson
14:45 Progress in EU Standardisation Dr Steve
Norval
15:00 Report on Structural Materials Workshop Ms Judith
Shackleton
15:15 Report on DARTS Technology Workshop Dr Liz
Town-Andrews
15:30 Radiological Safety: Impact of IRR-99 Mr Phil
Tattersall
16:00 Tea and Disperse
For further information contact:
Chris Frampton, Roche Discovery Welwyn, Broadwater Rd,
Welwyn Garden City, Hertfordshire AL7 3AY.
Tel: 01707 366272 (office) 366031 (lab) Fax
: 01707 366907
Email: [email protected]
|
Industrial Group of the BCA