Archive of Notices of Past meetings of the Industrial
Group
Contents This file contains notices for
meetings held in 1990 to 1994 :
- 1994 Autumn Meeting Real problems, real
solutions Raychem Ltd, Swindon
- 1994 Spring MeetingThin Layers,
Non
-Ambient Newcastle
- 1993 Autumn Meeting Crystallography in
Industry BICC, Wrexham
- 1993 Spring Meeting Hardware and
Software Manchester
- 1993 Spring Meeting PDF Workshop
Manchester
- 1992 Autumn Meeting Applications of Profile
Fitting and Simulation Health & Safety Executive,
Sheffield
- 1992 WorkshopBasic Line Profile
AnalysisICI Chemicals &Polymers, Runcorn
- 1992 WorkshopThe Impact of Quality Assurance
on X-ray Diffraction LaboratoriesBP Research
- 1992 Spring Meeting(Joint PCG)Texture, Swear
by results Liverpool
- 1991 Autumn MeetingCrystallography in
Industry RAE, Farnborough, Hants
- 1991 Spring MeetingQuantitative, Metals and
Al
loys Sheffield
- 1990 Spring MeetingTechniques, Invited
Lectures Exeter
- 1990 Autumn MeetingAmorphous Materials
Pilkington, Lathom
- 1990 WorkshopMicrostructural Properties from
Line Profile AnalysisICI Chemicals &Polymers,
Runcorn
- 1990 WorkshopAdvance Your PDF
SkillsDaresbury
Real problems, real solutions Raychem Ltd,
Swindon
3rd NOVEMBER 1994
- 10.00
- Registration and Coffee
- 10.30
- Introduction and Welcome
Dr. R. Reid, Raychem Ltd
- 10.40
- X-Ray Diffraction in Industrial Problem Solving
Mr. B.E. Fox, Raychem Ltd
- 11.05
- Analysis - the key that unlocks the problem
Mr. B.A. Bellamy, AE
A Technology, Harwell
- 11.30
- Quantitative Analysis of Alumina Trihydrate (ATH) in
Polymer Cables
Mr. V. Allain, Universite de Poitier
- 11.55
- Quantification of Crystoballite in Ceramic Fibre Furnace
Linings
Dr. M.A. Butler & Dr. D.J. Dyson, British Steel
- 12.20
- Digging in a Special Cement
Dr. B. Kinneging, Philips Analytical X-Ray Almelo
- 12.45
- LUNCH
- 14.00
- Presentation of BCA Industrial Group Award to Dr. I.
Ferguson
- 14.15
- "It's a Piece of Cake" the Characterisation of a single
sample of Aluminised Inconel
Dr. I. Ferguson
- 15.05
- Quantitative X-Ray Diffraction Analysis of Mineral and
Organic Phases in Organic Rich Rocks
Dr. R. Clapp & A. Mandile, Sietronics Manufacturing,
Australia
Click here to return to Section Contents
28-31 March 1994
INDUSTRIAL GROUP SESSIONS
Session 1 - Wednesday 30 March
THIN LAYER STUDIES
Chairman: Dr. S. V. Norval
- 10.30
- Thin film analysis - an overview and application
Dr P. F Fewster (Philips Research laboratories,
Redhill)
- 11.00
- Phase identification of thin films
Mr B E Fox (Raychem, Swindon)
- 11.25
- Near surface residual stresses in metallic materials for
gas turbines: -technology, problems and applications
Mr C J Small (Rolls Royce, Derby)
- 11.50
- Applications of thin film analysis
Dr. L. Bruggemann (Siemens, Karlsruhe)
- 12.15
- Reflectometry from thin polymer films
Dr R W Richards (University of Durham)
Session 2 - Thursday31March
- 09.00
IG Plenary Lecture - Chairman Dr R S Fletcher
High pressure studies using synchrotron radiation
Prof. O Shimomura (Photon Factory, KEK, Japan)
NON-AMBIENT CRYSTALLOGRAPHY
Chairman: Dr. J. Anwar
- 10.30
- The development of large volume high pressure cells at
Daresbury Laboratory
Dr S M Clark (Daresbury Laboratory)
- 10.50
- In situ structural studies of calalysts
Prof. C R A Catlow (The Royal Institution)
- 11.20
- A new cell for high temperature in situ X-ray diffraction
studies: design and early experiments
Dr D R Bates (British Gas plc)
- 11.40
- Low temperature studies of membrane lipid phase
transitions
Dr P Williams (King's College, London)
- 1215
- Industrial Group AGM
Click here to return to Section Contents
CRYSTALLOGRAPY IN INDUSTRY, BICC Cables Ltd, Wrexham
Technology Centre, Wrexham, Clwyd
4th November 1993
- 10.00
- Registration and coffee
- 10.30
- Introduction and Welcome
Denis Groombridge, Wrexham Technology Centre
- 10.45
- X-ray and Neutron Scattering from Liquid Crystals
Rob Richardson, University of Bristol
- 11.20<
/dt>
- Crystallographic Modelling in Industry
Steve Maginn, Molecular Simulations
- 11.55
- Profile Fitting made simple
Trevor Carter, AWE
- 12.20
- The 'Use of the Powder Diffraction File' Course at the
1993 BCA Tim Hyde, Johnson Matthey Technology Centre
- 12.45
- Lunch
- 2.00
- Presentation of Industrial Group Awards to Colin Baxter and
Colin Dineen
- 2.15
- Max von Laue - his part in my downfall
Colin Baxter, Rolls Royce
- 2.55
- Coffee Quantitative Analysis
Judith Shackleton, Philips Analytical X-Ray
- 3.05
- X-Ray Diffraction for Materials Science at Daresbury
Bob Cernik, Daresbury Laboratory
- 3.40
- Tea and close of meeting
Click here to return to Section Contents
INDUSTRIAL GROUP WORKSHOP
Advance Your PDF Skills
Attend a JCPDS-ICDD Short Course and Workshop
... For X-ray Powder Diffractions at All Levels
.....from Novice to Skilled Practitioner
In association with the BCA Spring meeting at Manchester, a 2
day course is being offered by the Industrial Group of the BCA
and JCPDS-ICDD in methods of identification and characterisatio
n
of crystalline substances through the use of powder diffraction
data. The course lecturer will be Ron Jenkins JCPDS-ICDD,
Swarthmore, USA.
The purpose of this course is to build proficiency of the user
in the interpretation of experimental powder data, especially in
the application of information provided in the Powder Diffraction
File.
Course emphasis is placed on the practical use of the Powder
Diffraction
File: On the type of information it contains ... the way this
information is organised ... how data may be retrieved and
interpreted ... how interpretation is affected by accuracy of
experimental data ... how to detect and understand common
instrumental and specimen induced errors.
Hands on work sessions. Use of both manual and computer/search
methods.
Descriptive workbook with illustrative examples.
The course is arranged around the industrial Group sessions at
the BCA Spring meeting and attendance is conditional on
registration
for at least 3 days with a supplement of £25
for the course.
DATE 29-31 March, 1993
VENUE Manchester Spring meeting (3 days registration
obligatory)
For further information, write or call:
Eric Kelly,
EA Technology.
Analytical Services.
Capenhurst.
CHESTER. CH1 6ES.
Click here to return to Section Contents
Commercial Powder Diffractio
n - Hardware
Monday 29th MARCH 1993
- 14.00
- Bradley and the powder method in Manchester
Dr C J E Kempster (UMIST, Manchester)
- 14.10
- Advances in X-ray diffraction
Dr A Rehfeldt-Oskierski (Siemens, Karlsruhe, Germany)
- 14.35
- Position sensitive detectors in powder diffractometry
Dr B Baumgartner (Stoe and Cie, Darmstadt, Germany)
- 15.00
- As good as new
M
r A Bagley (Hiltonbrooks, Knutsford, Cheshire)
- 15.10
- The Cryostream cooler
Dr A M Glazer (Oxford Cryosystems)
- 15.20
- High Temperature Attachment
Mr R Green (GTP)
- 15.30
- Tea
- 16.00
- Innovation in XRD hardware
Dr R Nicholls (Philips Analytical X-ray, Cambridge)
- 16.25
- Fast powder data collection on the curved position
sensitive detector syst
em PDS120
Dr P U Pennartz (Enraf-Nonius, Delft, Holland)
- 16.50
- Alignment and Data quality
Dr R Jenkins (ICDD, Swarthmore, USA)
- 17.20
- Question Session
- 17.30
- Close
State of the Art Search-Match Software
Wednesday 31st MARCH 1993
- 09.00
- How Soon will the PC replace the paper search manual
Dr R Jenkins (international Centre for Diffraction Data,
S
warthmore, USA)
- 09.30
- Automated multicomponent phase identification using fuzzy
sets and inverted database search
Dr A van den Boom (Philips Analytical X-ray, Cambridge)
- 10.00
- New software for the CPS120
Dr P U Pennartz (Enraf-Nonius, Delft, Holland)
- 10.30
- Coffee
- 11.00
- Search/match using full trace scans: an improvement over
using DI files.
Mr J Nusinovici (Siemens/Socabim
, Paris)
- 11.30
- Using the new Philip's PC Identity and PC-Extend
Software
Miss J Shaddeton (Philips)
- 12.00
- The STOE search-match program for PCs
Dr B Baumgartner (Stoe & Cie, Darmstadt, Germany)
- 12.30
- Close
Click here to return to Section Contents
APPLICATIONS OF PROFILE FITTING AND SIMULATION Health
& Safety Executive Laboratories, Sheffield
5th November 1992
- 10.00
- Registration and coffee
- 10.30
- Introduction and Welcome
- 10.40
- Direction-dependent Diffraction Effects in Line Profile
Analysis
Ian Langford, University of Birmingham
- 11.20
- Improving Line Profile Analysis by Means of Line Profile
Simulations
Jurgen van Berkum, Delft Unive
rsity of Technology
- 11.55
- Polymer Characterisation from Profile Fitting
Jo Jutson BICC, Wrexham
- 12.25
- The ab initio Structure Determination of Zr114
Orthosulphate from Laboratory Powder Data
David Gascoigne, Birkbeck College
- 12.50
- Lunch
- 2.00
- Powder Diffraction Patterns to Stick Diagrams
Bill David, Rutherford Appleton Laboratory
- 2.35
- M
ultiphase Pattern Fitting as an Aid to XRPD
Analysis
Craig Adam, Staffordshire University
- 3.05
- Strain Measurements in Cold- rolled and Annealed Titanium
and Titanium Alloys
H Singh Ubhi, RAE, Farnborough
- 3.35
- Simulation of XRD Line Profiles
Steve Norval, ICI Wilton Materials
- 4.00
- Tea and close of meeting
Click here to return to Section Contents
14th October, 1992
- 10.00
- Registration and Coffee
- 10.30
- Morning Session - Getting good data
-experimental requirements
-deconvolution
-Fourier coefficients -profile fitting software
- 12.45
- LUNCH
- Afternoon session
- 14.00
- Interpretation of line broadening informati
on
-use of line breadths
-use of Fourier coefficients
-size/strain software
- 16.00
- Tea & Close
To be held at:
BP RESEARCH, SUNBURY-ON-THAMES on 9th JULY 1992
The Industrial Group is holding a one-day meeting on the above
topic, which will cover:
- NAMAS ACCREDITATION
- ISO 9000
or BS 5750
- PRESENTATIONS FROM ACCREDITED LABORATORIES
- DISCUSSIONS OF THE MAJOR ISSUES
Further information will be available shortly and will be
circulated to members of the Industrial Group. If you are
interested in attending and would like to receive further
information please contact:
Dr S R Fletcher
ICI Chemicals & Polymers Limited
PO Box 8
The Heath
Runcorn, Cheshire
WA7 4QD
PHYSICAL CRYSTALLOGRAPHY GROUP& INDUSTRIAL GROUP
TEXTURE IN POLYCRYSTALLINE MATERIALS
TUESDAY, 3lst MARCH, 1992
Morning Moderator - Dr. Bruce Forsyth
- 9.30
- Orientation in Animals and humans
Prof. G.E. Bacon, University of Sheffield
- 10.15
- Diffraction from Thin Polycrystalline Layers
Dr. P.F. Fewster, Philips Research Laboratories
- 11.30
- Presentation of Physical Crystallography Philips Award
& Physical Crystallography Group - Oral Poster Session
- Afternoon Moderator - Dr. Alun Bowen
- 2.15
- Orientation Studies of Thin- films of Superconductors
Ms. J.A. Edwards, Royal Signals and Radar Establishment
- 2.45
- Application of Microtexture to the measurement of Grain
Boundary Geometrical Parameters
Dr. V. Randle, University of Bristol
- 3.15<
/dt>
- Structural Studies of Thin films of Lithium Niobate
Prepared for Electro-Optic Devices
Drs. H. Robinson and H.J. Milledge, University College
London
WEDNESDAY,1st APRIL,1992
CAN YOU SWEAR BY YOUR RESULTS?
PROVING A POINT BY X-RAY DIFFRACTION.
Moderator David Rendle
- 09.30
- The Role of the Crystallographer as Expert Witness in
Patent Litigation
Michael Glazer (The Clarendon Laboratory, Oxfo
rd) and
Stephen Tarling (Birkbeck college)
- 10.30
- Operation Trooper
Edward Glazier & David Rendle (The Metropolitan Police
Laboratory)
- 11.00
- Coffee
- 11.30
- Quality control methods in Titanium Dioxide production
Brian Bennett (TIOXIDE UK Ltd, Stockton-on-Tees)
- 11.55
- Environmental monitoring
Ray Fisher & David Dyson (British Steel Technical,
Rotherham)
- 12.20
- It is PATENTLY obvious that old equipment can sometimes
save a fortune
Brian Bellamy (AEA industrial Technology, Harwell)
- 12.35
- When is a crystal not a crystal?
James Nelson (McCrone Research Associates)
Click here to return to Section Contents
Crystallography in Industry Royal Aircraft Establishment,
Farnborough
7 NOVEMBER 1991
PROGRAMME
- 1.
- Registration and coffee
- 2.
- The role of microstructural analysis in the design,
production and application of aerospace materials.
A.W. Bowen RAE Farnborough
- 3.
- Residual stresses induced by electro-polishing.
D.C. Empson Rolls Royce, Bristol
- 4.
- Metal complex aggregation in solution.
A.G. Orpen Bristol University
- 5
.
- The Crystallographic studies of impurities in silicon.
C. Thompson Birkbeck College, London
- 6.
- Structures from powders by synchrotron radiation.
S.J. Andrews ICI Chemicals and Polymers
- 7.
- Pressure-induced phase transformations in molecular
crystals.
A.K. Sheridan & J. Anwar King's College, London
- 8.
- Presentation of Industrial Group Award for 1991
Click here to return to Section Contents
Quantitative Phase Analysis in Industry
Tuesday 26th March
- 15.30
- An idiots introductory guide to quantitative analysis.
Stephen E Tarling (Birkbeck College, London)
- 16.00
- Preparation of Single Phase Bismuth-based 2212 and 2223
Superconducting oxides and Quantitative X-ray diffraction
Analysis
of 2212 and 2223 phase mixtures.
Brian Bellamy (A.E.A.Harwell Laboratory)
- 16.15
- Quantitative applications using Philips APD software.
Judith Shackleton (Philips Scientific)
- 16.30
- Semi-Thin Layer Analysis.
Steve V Norval (ICI Wilton Materials Research Centre)
- 16.50
- Quantitative X-ray diffraction analysis in the
Occupational Medicine and Hygiene Laboratory.
M Jeyaratnam (Health and
Safety Executive, London)
- 17.10
- Quantitative Phase Analysis from Dynamic data.
Jamshed Anwar (Kings College London)
- 17.30
- Close
X-ray Diffraction from Metals and Alloys
Wednesday 27th March
- 9:00
- Introduction
- 9:05
- X-ray Powder Diffraction Studies of some alloys processed
by unconventional methods.
Bob A Buckley (Sheffield University)
- 9.35
- Sigma phase in nickel based superalloys - who needs X-ray
diffraction?
Colin J Small (Rolls Royce plc, Derby)
- 9.55
- Questions
- 10.00
- Coffee
- 10.30
- Consumer Crystallography.
Ian L Dillamore (INCO Engineered Products, Derbyshire)
- 11.00
- The development of crystallographic misorientation during
hot tensile deformation of an Al-Li-Mg-Cu alloy.
P
eter S Bate (Birmingham University)
- 11.20
- The importance of X-ray diffraction in the non-destructive
characterisation of high strength aluminium alloys.
Alun W Bowen (Royal Aerospace Establishment,
Farnborough)
- 11.40
- Texture measurements in ferritic stainless steel.
Colin W Haworth (British Steel Technical, Rotherham)
- 12.00
- Pole figures without diffraction or sample
destruction.
John J Jones (Mc
Gill University, Montreal)
- 12.20
- Questions
- 12.30
- Lunch
Click here to return to Section Contents
ANALYSIS OF MATERIALS WITH AMORPOUS CONTENT, PILKINGTON
TECHNOLOGY CENTRE
1 NOVEMBER 1990
PROGRAMME
- 10.00
- Registration and coffee
- 10.30
- Introduction and welcome
F J Cliffe - Group Chief Analyst, Pilkington plc
- 10.35
- X-ray diffraction in the study of glass
D J Taylor - Pilkington Technology Centre
- 11.05
- Small angle scattering of electrons from amorphous
silicon
A Craven - University of Glasgow
- 11.30
- X-ray absorption spectroscopy for the study of amorphous
structures
R P Pettifer - University of Warwick
- 12.10
- The use of s
ynchrotron eoge-topography to reveal thin
one-dimensionally disordered layers in silicon carbide
J F Kelly & P Barnes - Birkbeck College, London
- 12.35
- Lunch
- 14.00
- X-ray studies of polymers
P B McAllister - BICC Cables
- 14.30
- The "glass" content of granulated slag
W Gutteridge - British Cement Association
- 15.00
- Studies of amorphisation reactions by x-ray and neutron
scat
tering
N Cowlam - University of Sheffield
- 15.30
- Small angle x-ray scattering study of polymeric zirconium
species in aqueous solution
J Jutson, R M Richardson, S L Jones and C Norman -
University of Bristol
- 16.00
- Tea and Close
Click here to return to Section Contents
Techniques Workshop
Wednesday 4th April
Chair : Dr S V Norval
- 1.45
- Introduction and Welcome
- 1.50
- On the usefulness of highly-asymmetric x-ray scattering
geometries in epitaxial layer analysis
Dr T Ryan (Philips. Almelo)
- 2.10
- Energy-dispersive powder diffraction
Mr S M Clark (SERC Daresbury Laboratory)
- 2.30
- Special applications in x-ray diffraction : texture and
stress
Dr C Nauer-Gerhardt (Siemens, Karlsr
uhe)
- 2.55
- SIROQUANT: a commercially available quantitative and
structural analysis package for XRD phase analysis
Dr J C Taylor (CSIRO and Sietronics)
- 3.15
- TEA & CLOSE
Invited Lecture Session
Thursday 5th April
Chair: Dr A W Bowen
- 9.15
- Introduction and Welcome
- 9.20
- X-ray residual stress measurements for aerospace
applications
Dr M
R James (Rockwell International, Thousand Oaks)
- 10.00
- Structure analyses and time-resolved studies by
conventional x-ray powder diffractometry
Dr D Louer (Rennes)
- 10.40
- COFFEE
Chair : Dr S R Fletcher
- 11.10
- High-temperature x-ray diffraction at the Harwell
Laboratory
Mr B A Bellamy (AEA Technology, Harwell)
- 11.40
- Solving zeolite structures from powders by
x-ray and
electron diffraction
Dr M Shannon (ICI, Runcorn)
- 12.15
- X-ray topogrophy and lattice parameter measurements of
synthetic diamonds
Dr A M Moore (Royal Holloway SI Bedford New College)
- 12.45
-
- CLOSE & LUNCH
Click here to return to Section Contents
The programme for this symposi
um, which is being run by Ian
Langford and Steve Fletcher, will include:
- Elementary theory of line broadening
- Experimental considerations and data treatment
- Line broadening analysis techniques, including
-
- Warren-Averbach
- single line analysis
- pattern decomposition
- Examples and industrial applications
Sinc
e the symposium was advertised in the last edition of
Crystallography News there have been over thirty replies. This
means that we are now approaching the upper limit on the numbers
that we can accommodate. So if you are interested in attending,
please send your registration form as soon as possible to:
Dr S R Fletcher
R&T Department
ICI Chemicals & Polymers Ltd
The Heath, Runcorn
Cheshire, WA7 4QD
If there is more interest in this symposium than we can
a
ccommodate this time, it is quite probable that the Industrial
Group will repeat the event in the future. So if you are
interested please let us know, even if for one reason another you
are unable to attend this particular symposium.
Bursaries are available for suitable students or
trainee/practising crystallographers. Details of these and
application forms are available from:
Dr J E Chisholm
Mineralogy Department
British Museum (Natural History)
Cromwell Road
Lo
ndon SW7 5BD
Click here to return to Section Contents
Attend a JCPDS-ICDD Short Course and Workshop
... For X-Ray Powder Diffractionists at All Levels, from
Novice to Skilled Practitioner
A 3 day course is being offered by the Industrial Group of the
BCA and JCPDS-ICDD in methods of identification and
characterisation of crystalline substances through the use of
powder diffraction data.
The main course lecturer will be Ron
Jenkins JCPDS-ICDD.
The purpose of this course is to build proficiency of the user
in the interpretation of experimental powder data, especially in
the application of information provided in the Powder Diffraction
File.
Course emphasis is pieced on the practical use of the Powder
Diffraction File: On the type of information it contains ... the
way this information is organised ... how data may be retrieved
and interpreted... how interpretation
is affected by accuracy of
experimental data ... how to detect and understand common
instrumental end specimen induced errors.
Hands on work sessions. Use of both manual and computer/search
methods. Descriptive workbook with illustrative examples.
DATE February 16-18, 1990
VENUE Daresbury
For further information, write or call:
John Harding
Room 1318
British Rail Research
London Road
Derby DE2 8U
P
|
Industrial Group of the BCA