The crystallography is described in a logical sequence and is well illustrated providing clear explanations of point group and space group symmetry. General X-ray scattering processes are considered in a formal manner leading naturally to the structure factor and Braggs Law. A chapter on data collection provides particularly clear descriptions of the oscillation and Weissenberg camera methods. This forms a good practical reference. Perhaps of particular note is a section examining the physical and optical properties of crystals and how these are related to crystal symmetry. As expected, structure determination is comprehensively presented through concise descriptions of trial & error methods, the Patterson function, heavy atom method, anomalous scattering and direct methods. All are illustrated by carefully worked examples. The final chapter deals with the accuracy of the refinement process.
At first sight, the edition appears similar to the first. However, a significant change (and certainly an enhancement) is the inclusion of FORTRAN(R) listings for a series of 12 computer programs. The arduous task of typing these is not necessary as a WWW address is provided from which the source codes can be downloaded. However, at the time of writing this was apparently unavailable. In a relatively inspired approach, the reader is able to use the programs to perform guided calculations at various points within the text, albeit for 2-D only. For example, based upon an artificial structure provided, structure factors and a Patterson map can be calculated and examined.
The inclusion of sections covering synchrotron radiation, image plates and Laue methods for proteins are also new for this edition. However, the section on optical diffractometers has been excluded. This is perhaps disappointing as the visual impact of optical diffraction patterns and the optical analogue are powerful teaching aids.
Overall, this is a comprehensive text of fundamental principles and theory delivered, on the whole, in a traditional manner. The text is also supported at the end of each chapter by problems with adequate solutions. Any potential purchaser would certainly receive value for money especially as a softback version is also available at �22.95. Although perhaps not a book for the occasional user, I would wholeheartedly recommend this as a solid, formal text for the serious X-ray crystallographer.
Keith Rogers April 1997
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